Welcome to technoteZONE
You've made EN-Genius Network's technical notes among the most-read of any online engineering resource. Regular contributor Dennis Feucht spearheads this comprehensive ZONE.
Latest Additions
acquisitionZONE
• Avoiding Performance Pitfalls for the Pulse Response of High-Speed Op Amps: Part 2
(Michael Steffes - March 31, 2008) |
• Avoiding Performance Pitfalls for the Pulse Response of High-Speed Op Amps: Part 1
(Michael Steffes - February 4, 2008) |
• Choose A Digitally-Controlled Potentiometer Instead Of A DAC?
(Tamara Schmitz and Heather Babcock, Intersil Corporation - October 8, 2007) |
• Operational Amplifier Stability: Part 10 of 15
(Tim Green, Linear Applications Engineering Manager, Burr-Brown Products from Texas Instruments - September 24, 2007) |
• Boost Your Bandwidth with a Little Extra Microstrip
(Navid Mostafavi, Applications Engineer, Intersil Corporation - August 13, 2007) |
• Analog-To-Digital Converters
(Bonnie C. Baker and Russell Anderson, Texas Instruments - July 23, 2007) |
• Developing A Precise Pt100 RTD Simulator For SPICE
(Thomas Kuehl, Senior Applications Engineer, Texas Instruments Incorporated
- May 28, 2007) |
• Designing SAR ADC Drive Circuitry: Part III
(Rick Downs, Applications Engineering Manager, and Miro Oljaca, Systems Engineer, Data Acquisition Products,
Texas Instruments - March 12, 2007) |
• Operational Amplifier Stability - Part 9 of 15: Capacitive Load Stability: Output Pin Compensation
(Tim Green, Linear Applications Engineering Manager, Burr-Brown Products from Texas Instruments Incorporated - December 11, 2006) |
• Basic Guidelines For Using Analog-To-Digital Converters
(Gary Hendrickson, Intersil Corporation - November 20, 2006) |
• Design For A Wideband Differential Transimpedance DAC Output Interface
(Michael Steffes,
Market Development Manager, High-Speed Signal Conditioning,
Texas Instruments Incorporated - October 23, 2006) |
• The Evolution Of Rail-to-Rail Amplifiers
(Mike Wong and Tamara Papalias,
Intersil Corporation - September 25, 2006) |
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audio/videoZONE
• Analysis and Measurement of Intrinsic Noise in Op Amp Circuits Part VIII: Popcorn Noise
(Art Kay, Senior Applications Engineer, Texas Instruments Incorporated - February 25, 2008) |
• Analysis and Measurement of Intrinsic Noise in Op Amp Circuits
(Art Kay, Senior Applications Engineer, Texas Instruments Incorporated - October 7, 2007) |
• Analysis and Measurement of Intrinsic Noise in Op Amp Circuits
(Art Kay, Senior Applications Engineer, Texas Instruments Incorporated - August 13, 2007) |
• Analysis and Measurement of Intrinsic Noise in Op Amp Circuits: Part V - Introduction to Noise Measurement
(Art Kay, Senior Applications Engineer, Texas Instruments Incorporated - April 30, 2007) |
• Rail-to-Rail Amplifier With Integrated Charge Pump Improves Input Offset
(Mike Wong and Tamara Schmitz, Intersil Corporation - March 19, 2007) |
• Analysis And Measurement Of Intrinsic Noise In Op Amp Circuits Part lll
(Art Kay,
Senior Applications Engineer,
Texas Instruments Incorporated - December 4, 2006) |
• Analysis And Measurement Of Intrinsic Noise In Op Amp Circuit
(Art Kay,
Senior Applications Engineer,
Texas Instruments Incorporated - January 9, 2006) |
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connectivityZONE
• Signals From Noise
(Dave Van Ess, Principal Application Engineer, MTS, Cypress Semiconductor - April 14, 2008) |
• LVDS-Based SerDes Devices Can Simplify Video Interconnects
(Naresh B Shetty, Senior Analog Mixed-Signal Product Marketing Manager, Intersil Corporation - November 12, 2007) |
• Signals-From-Noise: The Incredible Mock Analog Low-Pass Filter
(Dave Van Ess, Principal Application Engineer, MTS, Cypress Semiconductor - October 22, 2007) |
• Signals-From-Noise: Slew-Limited Filters
(Dave Van Ess, Principal Application Engineer, MTS, Cypress Semiconductor - October 7, 2007) |
• Signals-From-Noise: Current Sources
(Dave Van Ess, Principal Application Engineer, MTS, Cypress Semiconductor - August 27, 2007) |
• What Sallen-Key Filter Articles Don't Tell You - Part III
(Dave Van Ess, Principal Application Engineer, Cypress Semiconductor - June 11, 2007) |
• Signals-from-Noise - What Sallen-Key Filter Articles Don't Tell You - Part II
(Dave Van Ess, Principal Applications Engineer, Cypress Semiconductor - May 14, 2007) |
• Signals-from-Noise: What Sallen-Key Filter Articles Don't Tell You, Part I
(Dave Van Ess, Principal Application Engineer, Cypress Semiconductor - April 9, 2007) |
• Signals-From-Noise: Single-Bit ADCs in a Nutshell - Part III
(Dave Van Ess, Principal Application Engineer, Cypress Semiconductor - March 5, 2007) |
• Firmware Emulation of an I2C Slave Device
(Steve Kolokowsky, Cypress Semiconductor
- October 30, 2006) |
• Signals-from-Noise Part II: Advanced DAC Techniques
(Dave Van Ess, Principal Application Engineer, Cypress Semiconductor - October 23, 2006) |
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connectorZONE
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designDEN
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dspZONE
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greenpowerZONE
• Replacing Halogen Lights With LEDs
(Fabien Franc, Catalyst Semiconductor - April 28, 2008) |
• Ensuring Efficiency and Reliability in Solar Power Inverters
(Jon Harper, Market Development Manager, Power Conversion & Industrial Products, Fairchild Semiconductor Europe - December 3, 2007) |
• Memory Selection Considerations for Energy-Efficient Data Centers
(Roland Barth and Jeff Hnatek, Qimonda AG - July 30, 2007) |
• White Goods Motor Controller Improves The Environment And The Bottom Line
(Jeffrey Reichard, CEO, Tier Electronics LLC, and Andrew Soukup, Worldwide TMS320C2000 Marketing Manager, Texas Instruments - November 20, 2006) |
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greentechZONE
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highpowerZONE
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lowpowerZONE
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networkZONE
• The Future of Electrical Signaling in a Post-10 Gbit/s World, Part VI
(Brad Booth, Senior Principal Engineer, AMCC - February 25, 2008) |
• The Future of Electrical Signaling in a Post-10 Gbit/s World, Part V
(David R Stauffer, IBM Microelectronics, ASIC Design Center - January 28, 2008) |
• Designing UTM With A Multi-Core Processor
(Mike Hui, Freescale Semiconductor, Inc. - January 14, 2008) |
• The Future of Electrical Signaling in a Post-10 Gbit/s World, Part IV
(Eric Bogatin, Bogatin Enterprises; and Mike Resso, Agilent Technologies - December 24, 2007) |
• The Future of Electrical Signaling in a Post-10 Gbit/s World, Part III
(Michael Fogg, Tyco Electronics - November 12, 2007) |
• The Future of Electrical Signaling in a Post-10 Gbit/s World
(Adam Healey, LSI Corporation - October 22, 2007) |
• The Future of Electrical Signaling in a Post-10 Gbit/s World
(John D’Ambrosia, Scientist, Force10 Networks - September 24, 2007) |
• Reaching Out: New Customers, New Applications
(Sigurd Schelstraete and Kenneth Madison,
Ikanos Communications, Inc
- August 20, 2007) |
• Standardized Thermal Requirements for AdvancedTCA Systems
(Pasi Vaananen, Systems Architect, Embedded Communications Computing
Motorola Inc
- August 6, 2007) |
• Testing And Interoperability Verification Of 10GBASE-LRM Optical Interfaces
(Marco Mazzini, Cisco Photonics - May 7, 2007) |
• The Role of Grandmaster, Boundary and Ordinary Clocks in IEEE 1588 Precision Time Protocol (PTP) for Frequency Synchronization Over Packet Networks
(by Jeremy Bennington, Senior Manager, Business Development, Symmetricom, Inc. - February 12, 2007) |
• High-Performance WiMAX RF Chipset Enables CPE And BTS Applications
(Russell Hoppenstein,
RF Applications Engineer,
Texas Instruments Incorporated - October 30, 2006) |
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programmablelogicZONE
• Fast, Flexible FPGA/FPGA Processor Memory Configuration
(Jim Weyand, Principal Systems Engineer, Embedded Systems Design, Inc. - April 7, 2008) |
• Implementing SPI-4.2 Using FPGAs
(Alex Goldhammer, Marketing Manager, Xilinx, Inc - October 1, 2007) |
• The Electronic Sleuth: Using Hard-Boiled Detective Work To Bridge The Gap Between Spec Sheets, Paper Designs, And The Real World
(Craig McKelvey,
Applications Engineering Manager, Cypress Semiconductor - November 6, 2006) |
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rlcZONE
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technoteZONE
• Cuk-Based Converter Concepts: Part 1
(Dennis L Feucht - May 5, 2008) |
• The End of Engineering
(Dennis L Feucht - April 14, 2008) |
• SEPIC PS1 10 W Converter Design Calculations
(Dennis L Feucht - March 10, 2008) |
• Method for Approximating Magnetic Core Power-Loss Density
(Dennis L Feucht - February 11, 2008) |
• Step Motors and Drives
(Dennis L Feucht - January 14, 2008) |
• Fan Motor Redesign
(Dennis L Feucht - January 7, 2008) |
• Practical Design Of A Buck Converter, Part V
(Dennis L Feucht - December 10, 2007) |
• Practical Design Of A Buck Converter, Part IV
(Dennis L Feucht - November 12, 2007) |
• Fan Motor Repair
(Dennis L Feucht - November 5, 2007) |
• Practical Design Of A Buck Converter
(Dennis L Feucht - October 1, 2007) |
• Practical Design of a Buck Converter
(Dennis L. Feucht - September 10, 2007) |
• The SEPIC Converter
(Dennis L. Feucht - September 3, 2007) |
• Practical Design of a Buck Converter
(Dennis L. Feucht - August 6, 2007) |
• Personal Energy Systems Calculations: Part II
(Dennis L. Feucht - July 2, 2007) |
• Personal Energy Systems Calculations: Part I
(Dennis L. Feucht - June 4, 2007) |
• Temperature Compensation Of BJT Differential Amplifiers
(Dennis L. Feucht - May 7, 2007) |
• Solar Thermoelectric Technology: Part 2
(Dennis L. Feucht - April 9, 2007) |
• Solar Thermoelectric Technology: Part 1
(Dennis L. Feucht
Innovatia Laboratories - March 5, 2007) |
• Self-Diagnosis Of Electronics With Analog Circuits - Developmental Concepts
(Dennis L. Feucht
Innovatia Laboratories - February 5, 2007) |
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test&measurementZONE
• Ten Points To Consider When Purchasing Your Next Oscilloscope
(Robert Lashlee, Learning Products Engineer, Agilent Technologies - March 24, 2008) |
• Exploring The Test Requirements For DisplayPort Receivers
(Dr Michael Herz, Digital Applications Specialist, Agilent Technologiesexamine what comprises a typical DisplayPort receiver test set-up. - January 14, 2008) |
• Make Simultaneous Data Acquisition Beneficial and Cost-Effective
(Tim Ludy, Product Marketing Manager, Data Translation - October 29, 2007) |
• Digitizing Real-time Scopes Can Speed Validation For 10/1000Base-T And 100Base-TX
(Daniel Choong, Product Manager, Wireline Testing Applications, High Performance Oscilloscopes, Agilent Technologies - October 15, 2007) |
• Deep-Memory In PC-Connected Scope Adapters As Important As Bench Scopes
(Jeff Bronks, Pico Technology plc; and Alan J Lowne, Saelig Co Inc - October 8, 2007) |
• System Level Approach To Jitter Problems In High-Speed Digital Transmission
(Greg D. Le Cheminant, Measurement Applications Specialist for Digital Signal Analysis Products, Digital Verification Solutions Division, Agilent Technologies - September 24, 2007) |
• What Makes Bit-Error Ratio Testing With Integrated CDR Beneficial?
(Michael Fleischer, Agilent Technologies - July 23, 2007) |
• New Technique Accurately Measures Low-Frequency Distortion To
(Xavier Ramus, Applications Engineer,
Texas Instruments Incorporated - October 2, 2006) |
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wirelessZONE
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