Welcome to technoteZONE
You've made EN-Genius Network's technical notes among the most-read of any online engineering resource. Regular contributor Dennis Feucht spearheads this comprehensive ZONE.
Latest Additions
acquisitionZONE
• Operational Amplifier Stability - Part 11 of 15: Modeling Complex Zo for Op Amps
(Tim Green,
Senior Staff Systems Engineer, Apex Precision Power, a division of Cirrus Logic, Inc - May 7, 2012)
|
• Harmonic Distortion: Part II
Understanding The Effects Of Closed-Loop Gain And Common-Mode Errors On THD+N
(Jorge Vega, Characterization Engineer, Texas Instruments - April 23, 2012)
|
• Harmonic Distortion: Part I - Understanding Harmonic Distortion Vs. Frequency Measurements in Op Amps
(Jorge Vega, Characterization Engineer, and Raj Ramanathan, Analog Design Engineer, Texas Instruments - January 30, 2012)
|
• Development of a Spice Macro-Model For Fully-Differential Amplifiers
(Jian Wang and Gwilym Luff, Intersil Corporation - July 25, 2011)
|
• Improved Sallen Key Low Pass Designs Exploit Modern Components and Design Tools
(Michael Steffes, Senior Applications Manager, Intersil Corporation - October 18, 2010)
|
• Why Active Cascoding Is Ideal for Folded-Cascode Amplifier Stages
(Philip Golden, Principal Design Engineer, Intersil Corporation - September 13, 2010)
|
• Differential Dc-Coupled ADC interface With Common-Mode Control to the ADC Inputs
(Michael Steffes, Senior Applications Manager, Intersil Corporation - May 10, 2010)
|
• Collider Passes Smoke Test
(Dennis L Feucht - March 1, 2010)
|
• Analog-To-Digital Converters
Part 4 Of 6: Move Your System Strategy To The Forefront In Your ADC Designs
(Bonnie C Baker, Senior Applications Engineer, Texas Instruments Incorporated - November 30, 2009)
|
• Electronics for High-Energy Particle Detection, Part II
(Erik Margan, R&D Engineer, Experimental Particle Physics Department, Jožef Stefan Institute, Ljubljana, Slovenia - February 2, 2009)
|
• Optimizing an RTC for Accuracy
(Jason Ngai & Tamara Schmitz, Intersil Corporation - January 26, 2009)
|
• Electronics for High-Energy Particle Detection, Part I
(Erik Margan, Guest Contributor; R&D Engineer, Experimental Particle Physics Department, Jožef Stefan Institute; Ljubljana, Slovenia - January 5, 2009)
|
• Efficient Tuning of Capacitive Sensing Designs
(Robert Jania, Cypress Semiconductor - August 25, 2008)
|
• Auto-Zero Noise Filtering Improves Instrumentation Amplifier Output
(Maurizio Gavardoni, Product Definer, Maxim Integrated Products Inc. - May 26, 2008)
|
• Analog-To-Digital Converters: Part 3 of 6
(Bonnie C Baker, Senior Applications Engineer, Texas Instruments Incorporated - May 19, 2008)
|
• Avoiding Performance Pitfalls for the Pulse Response of High-Speed Op Amps: Part 2
(Michael Steffes - March 31, 2008)
|
• Avoiding Performance Pitfalls for the Pulse Response of High-Speed Op Amps: Part 1
(Michael Steffes - February 4, 2008)
|
• Choose A Digitally-Controlled Potentiometer Instead Of A DAC?
(Tamara Schmitz and Heather Babcock, Intersil Corporation - October 8, 2007)
|
• Operational Amplifier Stability: Part 10 of 15
(Tim Green, Linear Applications Engineering Manager, Burr-Brown Products from Texas Instruments - September 24, 2007)
|
• Boost Your Bandwidth with a Little Extra Microstrip
(Navid Mostafavi, Applications Engineer, Intersil Corporation - August 13, 2007)
|
• Analog-To-Digital Converters
(Bonnie C. Baker and Russell Anderson, Texas Instruments - July 23, 2007)
|
• Developing A Precise Pt100 RTD Simulator For SPICE
(Thomas Kuehl, Senior Applications Engineer, Texas Instruments Incorporated
- May 28, 2007)
|
• Designing SAR ADC Drive Circuitry: Part III
(Rick Downs, Applications Engineering Manager, and Miro Oljaca, Systems Engineer, Data Acquisition Products,
Texas Instruments - March 12, 2007)
|
• Operational Amplifier Stability - Part 9 of 15: Capacitive Load Stability: Output Pin Compensation
(Tim Green, Linear Applications Engineering Manager, Burr-Brown Products from Texas Instruments Incorporated - December 11, 2006)
|
• Basic Guidelines For Using Analog-To-Digital Converters
(Gary Hendrickson, Intersil Corporation - November 20, 2006)
|
• Design For A Wideband Differential Transimpedance DAC Output Interface
(Michael Steffes,
Market Development Manager, High-Speed Signal Conditioning,
Texas Instruments Incorporated - October 23, 2006)
|
• The Evolution Of Rail-to-Rail Amplifiers
(Mike Wong and Tamara Papalias,
Intersil Corporation - September 25, 2006)
|
audio/videoZONE
• Analysis and Measurement of Intrinsic Noise in Op Amp Circuits Part XII: Photodiode Amplifier Noise (continued)
(Art Kay and Bryan Zhao, Texas Instruments Incorporated - January 23, 2012)
|
• Analysis and Measurement of Intrinsic Noise in Op Amp Circuits - Part XI: Photodiode Amplifier Noise
(Art Kay and Bryan Zhao, Texas Instruments Incorporated - December 5, 2011)
|
• Is Your Home Theater Setup Ruining Your Movie Experience?
(Alan Lofft, for Axiom Audio - October 25, 2010)
|
• Video Coax CMV Compensation Networks
(Rudy Berneike and David Laing, Intersil Corporation - April 19, 2010)
|
• Analysis and Measurement of Intrinsic Noise in Op Amp Circuits - Part X
(Art Kay, Senior Applications Engineer, Texas Instruments Incorporated - March 29, 2010)
|
• Modeling Electret Condenser Microphones in SPICE
(Collin Wells, Applications Engineer, Texas Instruments Incorporated - March 1, 2010)
|
• Optimizing Vcom to Maximize TFT-LCD Applications Performance
(Mike Ogier, Intersil Corporation - September 21, 2009)
|
• Dual Audio Potentiometers Deliver Power Savings for Consumer Audio Devices
(Brandon Howell & Tamara Schmitz, Intersil Corporation - June 8, 2009)
|
• Audio Click And Pop Noise Characterization And Elimination Techniques
(Allan Robinson and Tim Lok, Intersil Corporation - April 13, 2009)
|
• The Basics of Video: From Analog to HDTV (Part II)
(Mike Ogier & Tamara Schmitz, Intersil Corporation - March 23, 2009)
|
• The Basics of Video: From Analog to HDTV (Part I)
(Mike Ogier & Tamara Schmitz, Intersil Corporation - March 9, 2009)
|
• Overcoming Amplifier Electrical Overstress Problems
(Thomas Kuehl and Bonnie C Baker, Senior Applications Engineers, Texas Instruments Incorporated - March 2, 2009)
|
• Analysis and Measurement of Intrinsic Noise in Op Amp CircuitsPart IX: 1/f Noise and Zero-Drift Amplifiers
(Art Kay, Senior Applications Engineer, Texas Instruments Incorporated - December 1, 2008)
|
• Analysis and Measurement of Intrinsic Noise in Op Amp Circuits Part VIII: Popcorn Noise
(Art Kay, Senior Applications Engineer, Texas Instruments Incorporated - February 25, 2008)
|
• Analysis and Measurement of Intrinsic Noise in Op Amp Circuits
(Art Kay, Senior Applications Engineer, Texas Instruments Incorporated - October 7, 2007)
|
• Analysis and Measurement of Intrinsic Noise in Op Amp Circuits
(Art Kay, Senior Applications Engineer, Texas Instruments Incorporated - August 13, 2007)
|
• Analysis and Measurement of Intrinsic Noise in Op Amp Circuits: Part V - Introduction to Noise Measurement
(Art Kay, Senior Applications Engineer, Texas Instruments Incorporated - April 30, 2007)
|
• Rail-to-Rail Amplifier With Integrated Charge Pump Improves Input Offset
(Mike Wong and Tamara Schmitz, Intersil Corporation - March 19, 2007)
|
• Analysis And Measurement Of Intrinsic Noise In Op Amp Circuits Part lll
(Art Kay,
Senior Applications Engineer,
Texas Instruments Incorporated - December 4, 2006)
|
• Analysis And Measurement Of Intrinsic Noise In Op Amp Circuit
(Art Kay,
Senior Applications Engineer,
Texas Instruments Incorporated - January 9, 2006)
|
connectivityZONE
• Precision Analog Reference Voltage from Smaller, Low-cost Mixed-Signal Devices
(Archana Yarlagadda, Applications Engineer, Cypress Semiconductor - February 22, 2010)
|
• Signals From Noise: Calculating Delta-Sigma SNRs
(Dave Van Ess, Principal Application Engineer, MTS, Cypress Semiconductor - August 31, 2009)
|
• Lost in Translation: Interface Incompatibility in Embedded System Designs
(Meng He, Product Manager, Cypress Semiconductor Corporation - June 22, 2009)
|
• Signals From Noise: Constructing SINCk Decimators With A Subtractor
(Dave Van Ess, Principal Application Engineer, MTS, Cypress Semiconductor - May 11, 2009)
|
• An Overview of High-Speed Communications Over Twisted-Pair Cables
(Mark Sauerwald, Applications Engineer, MTS, National Semiconductor Corporation - April 6, 2009)
|
• A Practical Guide to Receiver Jitter Tolerance Testing, Part III: Tolerance Test On A PCI Express Add-In Card
(Michael Fleischer-Reumann, Agilent Technologies - March 16, 2009)
|
• A Practical Guide to Receiver Jitter Tolerance Testing, Part II: Jitter Generation
(Michael Fleischer-Reumann, Agilent Technologies - February 9, 2009)
|
• With A Good Cable Equalizer, An Engineer Can Go Far In This World
(Mark Sauerwald, Applications Engineer, MTS, National Semiconductor Corporation - January 12, 2009)
|
• A Practical Guide to Receiver Jitter Tolerance Testing, Part I :Receiver Principles and Signal Impairment Tolerance Test
(Michael Fleischer-Reumann, Agilent Technologies - December 8, 2008)
|
• Taking the Frustration Out of Hot Swapping sRIO Boards
(Trevor Hiatt and Raymond Ho, Communications Division, IDT - October 6, 2008)
|
• Signals From Noise
(Dave Van Ess, Principal Application Engineer, MTS, Cypress Semiconductor - September 15, 2008)
|
• Comprehending Non-Standard RS-485 Features
(Jeff Lies, Senior Analog Applications Engineer, Intersil Corporation - June 9, 2008)
|
• Signals From Noise
(Dave Van Ess, Principal Application Engineer, MTS, Cypress Semiconductor - April 14, 2008)
|
• LVDS-Based SerDes Devices Can Simplify Video Interconnects
(Naresh B Shetty, Senior Analog Mixed-Signal Product Marketing Manager, Intersil Corporation - November 12, 2007)
|
• Signals-From-Noise: The Incredible Mock Analog Low-Pass Filter
(Dave Van Ess, Principal Application Engineer, MTS, Cypress Semiconductor - October 22, 2007)
|
• Signals-From-Noise: Slew-Limited Filters
(Dave Van Ess, Principal Application Engineer, MTS, Cypress Semiconductor - October 7, 2007)
|
• Signals-From-Noise: Current Sources
(Dave Van Ess, Principal Application Engineer, MTS, Cypress Semiconductor - August 27, 2007)
|
• What Sallen-Key Filter Articles Don't Tell You - Part III
(Dave Van Ess, Principal Application Engineer, Cypress Semiconductor - June 11, 2007)
|
• Signals-from-Noise - What Sallen-Key Filter Articles Don't Tell You - Part II
(Dave Van Ess, Principal Applications Engineer, Cypress Semiconductor - May 14, 2007)
|
• Signals-from-Noise: What Sallen-Key Filter Articles Don't Tell You, Part I
(Dave Van Ess, Principal Application Engineer, Cypress Semiconductor - April 9, 2007)
|
• Signals-From-Noise: Single-Bit ADCs in a Nutshell - Part III
(Dave Van Ess, Principal Application Engineer, Cypress Semiconductor - March 5, 2007)
|
• Firmware Emulation of an I2C Slave Device
(Steve Kolokowsky, Cypress Semiconductor
- October 30, 2006)
|
• Signals-from-Noise Part II: Advanced DAC Techniques
(Dave Van Ess, Principal Application Engineer, Cypress Semiconductor - October 23, 2006)
|
connectorZONE
designDEN
dsp/mcuZONE
greenpowerZONE
• HBLED Lighting: What You Should Know and Nobody Will Tell You
(Ed Rodriguez - August 20, 2012)
|
• Tunable White Light
Theory and Practice For Achieving High-Quality Solid-State Lighting
(Madhan Kumar and Sachin Gupta, Cypress Semiconductors - November 15, 2010)
|
• Electronic HID Ballast Increases Efficiency and Extends Lamp Life
(Tom Ribarich, Director, Lighting Systems, International Rectifier - September 27, 2010)
|
• Demystifying Powerline Impedance: A Key to PLC Design Success
(Rahul Parsani, Cypress Semiconductor - August 16, 2010)
|
• Communications Flexibility Is Key To Interoperable “Smart” Grid
(Donna Imam and Mike Dow, Freescale Semiconductor - July 19, 2010)
|
• Power-Over-Ethernet Technology Hits Energy Crisis Head-On With Enterprise-Grade Performance and Reliability
(Daniel Feldman, Director of Marketing, Telecom Products, Microsemi Corporation - June 15, 2009)
|
• Energy Efficiency Ratings In Network Equipment
(Dave Schneider, Senior Technical Marketing Analyst, Ixia - April 13, 2009)
|
• Reducing System Power With A New NAND Flash Memory Interface
(Peter Gillingham, Vice President and Chief Technology Officer, MOSAID Technologies Inc. - January 19, 2009)
|
• Fast Recovery MOSFETs In Resonant Converters/Synchronous Rectification Applications
(Jon Harper, Market Development Manager, Industrial & White Goods Systems, Fairchild Semiconductor Europe - August 25, 2008)
|
• Replacing Halogen Lights With LEDs
(Fabien Franc, Catalyst Semiconductor - April 28, 2008)
|
• Ensuring Efficiency and Reliability in Solar Power Inverters
(Jon Harper, Market Development Manager, Power Conversion & Industrial Products, Fairchild Semiconductor Europe - December 3, 2007)
|
• Memory Selection Considerations for Energy-Efficient Data Centers
(Roland Barth and Jeff Hnatek, Qimonda AG - July 30, 2007)
|
• White Goods Motor Controller Improves The Environment And The Bottom Line
(Jeffrey Reichard, CEO, Tier Electronics LLC, and Andrew Soukup, Worldwide TMS320C2000 Marketing Manager, Texas Instruments - November 20, 2006)
|
greentechZONE
highpowerZONE
• A Simple Circuit to Generate Plus and Minus Supplies Using a Boost Regulator
(Don LaFontaine, Senior Design Engineer, Intersil Corporation - November 14, 2011)
|
• Selecting a Power Module for Your Application
(Zaki Moussaoui, Principal Applications Engineer, and
Sarika Arora, Product Marketing Manager; Intersil Corporation - March 1, 2010)
|
• Storing Power With Super Capacitors
(Tom DeLurio, Advanced Analogic Technologies Inc - June 22, 2009)
|
• Switching Analysis of Synchronous Rectifier MOSFETs With Phase-Shifted Full-Bridge Converter and Current Doubler
(Mark Hu, Product Application Manager, Vishay Siliconix - November 19, 2007)
|
• Power Savings Techniques for Electric Motor Systems
(Infineon Technologies AG - August 29, 2006)
|
lowpowerZONE
• A High-Voltage Bidirectional Current Source
(John Caldwell, Analog Applications Engineer, Texas Instruments - May 26, 2012)
|
• Level Shifting Between 1.8 V and 3.3 V Using I2C Buffers
(Tim Lok, Industrial General-Purpose Power Group, Intersil Corporation - January 2, 2012)
|
• Increasing Home Efficiency with High Brightness LEDs
(Tamara Schmitz, Intersil Corporation - March 29, 2010)
|
• Guide To Charging Sealed Lead Acid Batteries
(Tony Morgan, Senior Applications Engineer, Silvertel, Newport, South Wales - July 6, 2009)
|
• Desert Island Design: Bridging the Gap without Software
(Dave Ritter, Principal Applications Engineer, Intersil Corporation - September 22, 2008)
|
• Mixed-Signal Grounding Example
(Tamara Schmitz, Intersil Corporation - August 25, 2008)
|
• Grounding Techniques
(Tamara Schmitz, Principal Applications Engineer, Intersil Corporation - April 14, 2008)
|
• Power-Over-Ethernet: The Reality Of Designing A Powered Device
(by Tony Morgan
Silver Telecom Ltd - July 31, 2006)
|
networkZONE
• How Do Synchronous Ethernet And Precision Time Protocol Work?
(Per Lembre, Director of Product Marketing, Xelerated - October 19, 2009)
|
• How Do Synchronous Ethernet And Precision Time Protocol Work?
(Per Lembre, Director of Product Marketing, Xelerated - September 14, 2009)
|
• Using a Dual-Channel Sampler for Signal Monitoring
(Juan Garza, Product Marketing and Applications Manager, Vitesse Semiconductor Corporation - February 23, 2009)
|
• OAM Challenges in a Carrier Ethernet Network
(Stephen Christo and Robert Roden Ph.D, LightStorm Networks Ltd. - July 14, 2008)
|
• An Introduction To Security In IPsec
(Mike Borza and Al Hawtin - May 19, 2008)
|
• The Future of Electrical Signaling in a Post-10 Gbit/s World, Part VI
(Brad Booth, Senior Principal Engineer, AMCC - February 25, 2008)
|
• The Future of Electrical Signaling in a Post-10 Gbit/s World, Part V
(David R Stauffer, IBM Microelectronics, ASIC Design Center - January 28, 2008)
|
• Designing UTM With A Multi-Core Processor
(Mike Hui, Freescale Semiconductor, Inc. - January 14, 2008)
|
• The Future of Electrical Signaling in a Post-10 Gbit/s World, Part IV
(Eric Bogatin, Bogatin Enterprises; and Mike Resso, Agilent Technologies - December 24, 2007)
|
• The Future of Electrical Signaling in a Post-10 Gbit/s World, Part III
(Michael Fogg, Tyco Electronics - November 12, 2007)
|
• The Future of Electrical Signaling in a Post-10 Gbit/s World
(Adam Healey, LSI Corporation - October 22, 2007)
|
• The Future of Electrical Signaling in a Post-10 Gbit/s World
(John D’Ambrosia, Scientist, Force10 Networks - September 24, 2007)
|
• Reaching Out: New Customers, New Applications
(Sigurd Schelstraete and Kenneth Madison,
Ikanos Communications, Inc
- August 20, 2007)
|
• Standardized Thermal Requirements for AdvancedTCA Systems
(Pasi Vaananen, Systems Architect, Embedded Communications Computing
Motorola Inc
- August 6, 2007)
|
• Testing And Interoperability Verification Of 10GBASE-LRM Optical Interfaces
(Marco Mazzini, Cisco Photonics - May 7, 2007)
|
• The Role of Grandmaster, Boundary and Ordinary Clocks in IEEE 1588 Precision Time Protocol (PTP) for Frequency Synchronization Over Packet Networks
(by Jeremy Bennington, Senior Manager, Business Development, Symmetricom, Inc. - February 12, 2007)
|
• High-Performance WiMAX RF Chipset Enables CPE And BTS Applications
(Russell Hoppenstein,
RF Applications Engineer,
Texas Instruments Incorporated - October 30, 2006)
|
programmablelogicZONE
• Fast, Flexible FPGA/FPGA Processor Memory Configuration
(Jim Weyand, Principal Systems Engineer, Embedded Systems Design, Inc. - April 7, 2008)
|
• Implementing SPI-4.2 Using FPGAs
(Alex Goldhammer, Marketing Manager, Xilinx, Inc - October 1, 2007)
|
• The Electronic Sleuth: Using Hard-Boiled Detective Work To Bridge The Gap Between Spec Sheets, Paper Designs, And The Real World
(Craig McKelvey,
Applications Engineering Manager, Cypress Semiconductor - November 6, 2006)
|
rlcZONE
• Designing with Ceramic Capacitors
(Wolfgang Zeitler, Vishay Intertechnology - March 2, 2009)
|
• A Non-Dimensional Look at the R-L-C Equations
(Kent Edel, Senior Technical Sales Engineer, Freescale Semiconductor - February 23, 2009)
|
• Estimating Parasitic Inductance and Capacitance
(Ted Rees, Intersil Corporation - July 21, 2008)
|
• Increasing Compensation Efficiency By Going Analog
(Tim Warland, Applications Engineer, and Bob Frostholm, Vice President of Marketing, Microbridge Technologies - December 24, 2007)
|
technoteZONE
• Frequency Response Above Bandwidth
(Dennis L Feucht - September 24, 2012)
|
• Bandwidth from Transfer Functions
(Dennis L Feucht - August 27, 2012)
|
• Circuit Dynamics for Design
(Dennis L Feucht - July 23, 2012)
|
• The Changing Style of Electronics
(Dennis L Feucht - June 25, 2012)
|
• Rail-to-Rail Madness
(Dennis L Feucht - May 21, 2012)
|
• Analog Computing with Digital Integrators - Part II: Incremental Function Simulation and Analysis
(Dennis L Feucht - April 23, 2012)
|
• Analog Computing with Digital Integrators - Part I: Incremental Function Generation Using Integrators
(Dennis L Feucht - March 25, 2012)
|
• The Repair-Ware Revolution
(Dennis L Feucht - February 20, 2012)
|
• High-Side Current-Sense Circuit in One BJT Array
(Dennis L Feucht - January 23, 2012)
|
• Function Generator Circuit Concepts: Part 2
(Dennis L Feucht - December 19, 2011)
|
• Emitter Bypassing Speeds Amplifier
(Dennis L Feucht - December 5, 2011)
|
• Function Generator Circuit Concepts
(Dennis L Feucht - November 14, 2011)
|
• Bootstrapping
(Dennis L Feucht - October 10, 2011)
|
• Interpolation of Log Scales
(Dennis L Feucht - September 12, 2011)
|
• Give Cheap Op Amps and Comparators Rail-to-Rail Outputs
(Dennis L Feucht - August 15, 2011)
|
• Common-Base Bypassing: and How It Affects CB Frequency Response
(Dennis L Feucht - July 25, 2011)
|
• Two-Port Referral
(Dennis L Feucht - June 20, 2011)
|
• Analog Circuit Adjustments Give Way to Autocalibration
(Dennis L Feucht - May 16, 2011)
|
• Feedback Circuits and Two-Port Blocks: Part 2
(Dennis L Feucht - April 18, 2011)
|
• Feedback Circuits and Two-Port Blocks: Part 1
(Dennis L Feucht - March 14, 2011)
|
• Furnace Control
(Dennis L Feucht - February 14, 2011)
|
• The Enigmatic TL431 Voltage Regulator: Part Two
(Dennis L Feucht - January 24, 2011)
|
• The Enigmatic TL431 Voltage Regulator: Part One
(Dennis L Feucht - December 6, 2010)
|
• Data Acquisition and Instrumentation
Data Processing and Calibration
(Dennis L Feucht - November 8, 2010)
|
• Data Acquisition and Instrumentation:
The DAS & Sensors
(Dennis L Feucht - October 4, 2010)
|
• When Phase Angles for Reactances Are Not 90 Degrees
(Dennis L Feucht - September 6, 2010)
|
• Etched Circuit-Board Manufacturing Overview
(Dennis L Feucht - August 2, 2010)
|
• Converter Current-Loop Modeling
Toward Finished Business: A Simple Unified Model
(Dennis L Feucht - July 5, 2010)
|
• Converter Current-Loop Modeling
Unfinished Business
(Dennis L Feucht - June 6, 2010)
|
• Electronics Quiz # 2
(Dennis L Feucht - March 15, 2010)
|
• The Golden Ratio in Electronics
(Dennis L Feucht - November 9, 2009)
|
• Low-Power CCM Flyback Converter: Part 2
(Dennis L Feucht - October 12, 2009)
|
• The Form Factor Product
(Dennis L Feucht - August 3, 2009)
|
• Complementary BJT Configuration
(Dennis L Feucht - July 6, 2009)
|
• High-Side Current Sensing
(Dennis L Feucht - June 8, 2009)
|
• How Close Did Hitler’s Germany Come to the Atom Bomb?: German Nuclear Research During the 2nd World War
(Peter Starič - May 4, 2009)
|
• Cuk-Based Converter Concepts, Part VIII: Isolated Cuk Converters
(Dennis L Feucht - March 16, 2009)
|
• Low-Cost Compressed-Gas Power Source
(Dennis L Feucht - February 9, 2009)
|
• The Cuk-Based Converter Concepts, Part VII:Tapped-Winding SEPIC Converter
(Dennis L Feucht - January 19, 2009)
|
• Cuk-Based Converter ConceptsPart 6: Cuk Converter Ripple-Current Elimination
(Dennis L Feucht - November 3, 2008)
|
• Cuk-Based Converter Concepts - Part 5: SEPIC Control
(Dennis L Feucht - October 6, 2008)
|
• Banking, Money Dynamics, and Electronics
(Dennis L Feucht - September 1, 2008)
|
• Cuk-Based Converter Concepts: Part 4
(Dennis L Feucht - August 4, 2008)
|
• Cuk-Based Converter Concepts: Part 3
(Dennis L Feucht - July 7, 2008)
|
• Cuk-Based Converter Concepts: Part 2
(Dennis L Feucht - June 2, 2008)
|
• Cuk-Based Converter Concepts: Part 1
(Dennis L Feucht - May 5, 2008)
|
• The End of Engineering
(Dennis L Feucht - April 14, 2008)
|
• SEPIC PS1 10 W Converter Design Calculations
(Dennis L Feucht - March 10, 2008)
|
• Method for Approximating Magnetic Core Power-Loss Density
(Dennis L Feucht - February 11, 2008)
|
• Step Motors and Drives
(Dennis L Feucht - January 14, 2008)
|
• Fan Motor Redesign
(Dennis L Feucht - January 7, 2008)
|
• Practical Design Of A Buck Converter, Part V
(Dennis L Feucht - December 10, 2007)
|
• Practical Design Of A Buck Converter, Part IV
(Dennis L Feucht - November 12, 2007)
|
• Fan Motor Repair
(Dennis L Feucht - November 5, 2007)
|
• Practical Design Of A Buck Converter
(Dennis L Feucht - October 1, 2007)
|
• Practical Design of a Buck Converter
(Dennis L. Feucht - September 10, 2007)
|
• The SEPIC Converter
(Dennis L. Feucht - September 3, 2007)
|
• Practical Design of a Buck Converter
(Dennis L. Feucht - August 6, 2007)
|
• Personal Energy Systems Calculations: Part II
(Dennis L. Feucht - July 2, 2007)
|
• Personal Energy Systems Calculations: Part I
(Dennis L. Feucht - June 4, 2007)
|
• Temperature Compensation Of BJT Differential Amplifiers
(Dennis L. Feucht - May 7, 2007)
|
• Solar Thermoelectric Technology: Part 2
(Dennis L. Feucht - April 9, 2007)
|
• Solar Thermoelectric Technology: Part 1
(Dennis L. Feucht
Innovatia Laboratories - March 5, 2007)
|
• Self-Diagnosis Of Electronics With Analog Circuits - Developmental Concepts
(Dennis L. Feucht
Innovatia Laboratories - February 5, 2007)
|
wirelessZONE
• Exact Noise Figure Prediction For Transformer-Coupled Fully-Differential Amplifier
(Michael Steffes, Senior Applications Manager, High Speed Signal Path, Intersil Corporation - July 9, 2012)
|
• Integrated Sensor Nodes With GSM Modems
(Ajay Bharadwaj and Balaji Mamidala, Cypress Semiconductor - July 11, 2011)
|
• Precise VDSL2 Upstream MTPR Measurements: Implementation and Importance
(Raymond Ho, Intersil Corporation - November 1, 2010)
|
• Design And Construction Of A High-Frequency 3.3 V Transimpedance Amplifier
(Rea Schmid, Senior Analog Applications Engineer, Texas Instruments - November 17, 2008)
|
• EMI Susceptibility In Analog Circuits
(Walter Bacharowski, Staff Applications Engineer, National Semiconductor Corporation - August 4, 2008)
|
• Avago Designs 18 GHz And 26.5 GHz Low-Noise E-pHEMT
(Avago Technologies Technical Staff - May 19, 2008)
|
• Digital Wireless Sensor Telemetry
(Summation Research - March 6, 2006)
|
test&measurementZONE
• Breaking Network Test Lab Barriers
(Zohar Karni, QualiSystems - June 4, 2012)
|
• Perfecting Network Design
(Asim Rasheed, Ixia - May 14, 2012)
|
• Using an Oscilloscope for Debugging Serial Buses
(Doug Beck, Senior Usability Engineer, Agilent Technologies - May 18, 2009)
|
• What Is A Shaker?
(Wayne Tustin, Equipment Reliability Institute, Santa Barbara, California - April 27, 2009)
|
• Building a Test Platform to Characterize the Interference Sensitivity of an Audio Amplifier to RF signals
(Don LaFontaine, Intersil Corporation - February 2, 2009)
|
• High Fidelity Probing
(Jian Wang, AMS Communications Applications Group, Intersil Corporation - January 12, 2009)
|
• The Value Of Traceable S-Parameter Characterization Of Electro-Optical Components
(Oliver Funke, Product Manager, Digital Photonic Test, Digital Test Division, Electronic Measurements Group, Agilent Technologies - November 17, 2008)
|
• What Is A g Unit?
(Wayne Tustin, Equipment Reliability Institute, Santa Barbara, California - October 20, 2008)
|
• Complex UWB Signal Generation Using Advanced Waveform-Editing Tools
(Darren McCarthy, Technical Marketing Manager for RF Test, Tektronix Inc - August 25, 2008)
|
• Why Oscilloscope Measurements May Require Extreme Probing
(Jason Swaim, Mechanical Design Engineer; and Ned Brush, Hardware Design Engineer, Agilent Technologies, Inc - August 4, 2008)
|
• Ten Points To Consider When Purchasing Your Next Oscilloscope
(Robert Lashlee, Learning Products Engineer, Agilent Technologies - March 24, 2008)
|
• Exploring The Test Requirements For DisplayPort Receivers
(Dr Michael Herz, Digital Applications Specialist, Agilent Technologiesexamine what comprises a typical DisplayPort receiver test set-up. - January 14, 2008)
|
• Make Simultaneous Data Acquisition Beneficial and Cost-Effective
(Tim Ludy, Product Marketing Manager, Data Translation - October 29, 2007)
|
• Digitizing Real-time Scopes Can Speed Validation For 10/1000Base-T And 100Base-TX
(Daniel Choong, Product Manager, Wireline Testing Applications, High Performance Oscilloscopes, Agilent Technologies - October 15, 2007)
|
• Deep-Memory In PC-Connected Scope Adapters As Important As Bench Scopes
(Jeff Bronks, Pico Technology plc; and Alan J Lowne, Saelig Co Inc - October 8, 2007)
|
• System Level Approach To Jitter Problems In High-Speed Digital Transmission
(Greg D. Le Cheminant, Measurement Applications Specialist for Digital Signal Analysis Products, Digital Verification Solutions Division, Agilent Technologies - September 24, 2007)
|
• What Makes Bit-Error Ratio Testing With Integrated CDR Beneficial?
(Michael Fleischer, Agilent Technologies - July 23, 2007)
|
• New Technique Accurately Measures Low-Frequency Distortion To
(Xavier Ramus, Applications Engineer,
Texas Instruments Incorporated - October 2, 2006)
|
Back to Top
|
|
